CRYSTAL QUALITY

Introduction

X-ray rocking curve measurement is a technique used to evaluate the crystal quality of crystalline films and mono-crystal substrates. The peak width (FWHM) of measured rocking curve profiles contains information on the orientation distribution of crystal lattice planes (mosaic spread) within the sample. This orientation distribution can be directly used as a measure of perfection. The SmartLab diffractometer with high-resolution beam conditioner gives the necessary resolution to determine the perfection of high-quality crystalline films and substrates. 

Crystal Quality Evaluation by X-ray Rocking Curve Measurement

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Evaluation of uniformity of a single crystal substrate by rocking curve measurement

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SmartLab

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AUTOMATED MULTIPURPOSE X-RAY DIFFRACTOMETER (XRD) WITH GUIDANCE SOFTWARE

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