APPLICATION NOTES

POLYMORPHS

Evaluation of uniformity of thin film thickness by X-ray reflectivity mapping

B-XRD2030-Evaluation_of_uniformity_of_thin_film_thickness_by_X-ray_reflectivity_mapping_700x1000
EXPLORE

Micro-area mapping measurement of printed circuit boards 

B-XRD1089-Micro-area_mapping_measurement_of_printed_circuit_boards_700x1000
EXPLORE

Crystal phase analysis of a magnetic thin film by In-Plane XRD

B-XRD2003-Crystal_phase_analysis_of_a_magnetic_thin_film_by_In-Plane_XRD_700x1000
EXPLORE

Evaluation of curvature of a single crystal substrate by rocking curve measurement

B-XRD2031-Evaluation_of_curvature_of_a_single_crystal_substrate_by_rocking_curve_measurement_700x1000
EXPLORE

DISCOVERY

PREFORMULATION

FORMULATION

MANUFACTURING & QUALITY CONTROL

POLYMORPHS

High speed RSM of an epitaxial film using a 1D detector in still mode

B-XRD2021-High_speed_RSM_of_an_epitaxial_film_using_a_1D_detector_in_still_mode_700x1000
EXPLORE

Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM

B-XRD2026-Analysis_of_epitaxial_films_on_in-plane_anisotropic_substrates_by_wide-range_RSM_700x1000
EXPLORE

Analysis of uniaxially oriented film by wide-range RSM

B-XRD2025-Analysis_of_uniaxially_oriented_film_by_wide-range_RSM_700x1000
EXPLORE

High speed RSM of a III-nitride epitaxial film by 1D detection mode

B-XRD2024-High_speed_RSM_of_a_III-nitride_epitaxial_film_by_1D_detection_mode_700x1000
EXPLORE

DISCOVERY

PREFORMULATION

FORMULATION

MANUFACTURING & QUALITY CONTROL

POLYMORPHS

Evaluation of uniformity of a single crystal substrate by rocking curve measurement

B-XRD2027-Evaluation_of_uniformity_of_a_single_crystal_substrate_by_rocking_curve_measurement_700x1000
EXPLORE

Crystal defect analysis of a single crystal substrate by X-ray reflection topography

B-XRD2022-Crystal_defect_analysis_of_a_single_crystal_substrate_by_X-ray_reflection_topography_700x1000
EXPLORE

DISCOVERY

PREFORMULATION

FORMULATION

MANUFACTURING & QUALITY CONTROL

POLYMORPHS

DISCOVERY

PREFORMULATION

FORMULATION

MANUFACTURING & QUALITY CONTROL